Invited speakers

Daniel Araujo (University of Cadix, Spain) Input of cathodoluminescence in the semiconductor field. A review over the last 30 years

Mowafak Al-Jassim (NREL, USA) EBIC/CL on CdTe and CIGS solar cells

Toon Coenen (DELMIC, The Netherlands)  Angle-resolved cathodoluminescence microscopy : applications to semiconductors and plasmonic

Kim Donghwan (Korea) Degradation in photovoltaic devices

Nancy  Haegel (NREL, USA) Dual Probe Imaging: Combining Electron Beam Excitation and Near Field Scanning Optical Microscopy to Visualize Carrier Transport

Gwénolé Jacopin (EPFL, Switzerland) Hopping of bound excitons in ZnO microwires probed by time-resolved CL

Mathieu Kociak (LPS, France) Time-correlated CL of defect centers in diamond and hBN

Niklas Nilius (Max-Plank Institute, Germany) STM-luminescence spectroscopy of defects and impurities in oxides

Maura Pavesi (University of Parma, Italia) LBIC in tellurides for X-ray detection: transport properties and electric field reconstruction

Maria Tchernycheva (IEF, France) EBIC in InGaN/GaN core-shell nanowires

Milos Toth (UTS, Australia) Electron beam induced chemical processing and characterization of semiconductors

Maria Zamoryanskaya (IOFFE, Russia) Radiative center properties in wide bandgap semiconductors